Dawei Hu

City:

Milpitas, California

Country:

United States

Published Applications:

Last publication date:

2025-05-08

Top Assignees for applications by Dawei Hu

The entities that hold a legal rights for patent applications filed by inventor Hu Dawei:

Dawei Hu from Milpitas, US has applied for patents for these inventions. The list has both pending applications and granted patents:

TRANSISTOR CHANNEL STRESS AND MOBILITY METROLOGY USING MULTIPASS SPECTROSCOPIC ELLIPSOMETRY AND RAMAN JOINT MEASUREMENT

Methods And Systems For Systematic Error Compensation Across A Fleet Of Metrology Systems Based On A Trained Error Evaluation Model

Bandgap measurements of patterned film stacks using spectroscopic metrology

Bandgap measurements of patterned film stacks using spectroscopic metrology

InventorID:

2422732 ⎘