Suwon-si
South Korea
40
2026-01-29
The entities that hold a legal rights for patent applications filed by inventor LEE Jong-Hyun:
Jong-Hyun LEE from Suwon-si, KR has applied for patents for these inventions. The list has both pending applications and granted patents:
DISPLAY DEVICE
#2 | 2024-10-10DISPLAY DEVICE
#3 | 2024-03-28FINGERPRINT SENSOR DEVICE, DISPLAY DEVICE INCLUDING THE SAME, AND METHOD FOR DRIVING THE DISPLAY DEVICE
#4 | 2024-01-25DISPLAY DEVICE
#5 | 2023-04-20Display device
#6 | 2023-04-06DISPLAY DEVICE
#7 | 2023-03-09Display device
#8 | 2022-10-06Fingerprint sensor device, display device including the same, and method for driving the display device
#9 | 2022-07-28Pixel-type semiconductor light-emitting device and method of manufacturing the same
#10 | 2022-05-26Display device
#11 | 2022-03-10DISPLAY DEVICE
#12 | 2021-07-01Display device
#13 | 2020-05-14Test pattern, test method for semiconductor device, and computer-implemented method for designing integrated circuit layout
#14 | 2020-05-07Integrated circuit devices including a via and methods of forming the same
#15 | 2020-03-19BICYCLE LOCKING DEVICE HAVING ABNORMAL LOCKING PREVENTION FUNCTION, AND METHOD THEREFOR
#16 | 2019-10-24Pixel-type semiconductor light-emitting device and method of manufacturing the same
#17 | 2019-06-27Layout method
#18 | 2018-06-28Semiconductor device having dummy active fin patterns
#19 | 2018-01-11Wiring structure and method of forming a wiring structure
#20 | 2017-10-05Semiconductor device having dummy active fin patterns
#21 | 2017-09-21Method for manufacturing a semiconductor device
#22 | 2017-06-15Test pattern, test method for semiconductor device, and computer-implemented designing integrated circuit layout
#23 | 2017-06-08Wiring structure and method of forming a wiring structure
#24 | 2016-10-20Semiconductor device including line patterns
#25 | 2016-10-20METHOD OF FORMING A TEST STRUCTURE FOR DETECTING BAD PATTERNS, AND METHOD OF DETECTING BAD PATTERNS USING THE SAME
#26 | 2016-04-21Semiconductor light emitting device
#27 | 2016-02-11Semiconductor light emitting device, light emitting device package comprising the same, and lighting device comprising the same
#28 | 2013-05-16Semiconductor device and method of testing the same
#29 | 2012-10-04Semiconductor Device And Test Method For Semiconductor Device
#30 | 2008-08-07Apparatus for high power amplifier in wireless communication system
#31 | 2008-07-17Defect analysis methods for semiconductor integrated circuit devices and defect analysis systems
#32 | 2008-04-03Method and system of analyzing failure in semiconductor integrated circuit device
#33 | 2007-05-17High-power amplifier apparatus for TDD wireless communication system
#34 | 2007-04-05Test pattern of semiconductor device and test method using the same
#35 | 2006-11-07Test structure for detecting defect size in a semiconductor device and test method using same
#36 | 2006-10-05Analytic structure for failure analysis of semiconductor device
#37 | 2006-08-10Analytic structure for failure analysis of semiconductor device having a multi-stacked interconnection structure
#38 | 2006-06-08Structure and method for failure analysis in a semiconductor device
#39 | 2005-11-17RF front-end apparatus in a TDD wireless communication system
#40 | 2005-07-21Test pattern of semiconductor device and test method using the same
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