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Inventor profile of:

Bert Verstraeten

City:

Lommel

Country:

Belgium

Published Applications:

8

Last publication date:

2022-10-13

Top Assignees for applications by Bert Verstraeten

The entities that hold a legal rights for patent applications filed by inventor Verstraeten Bert:

ASML Netherlands B.V. 8 Veldhoven, Netherlands

Recent patent applications by Verstraeten Bert

Bert Verstraeten from Lommel, BE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2022-10-13

US20220326625A1

Method for process metrology

#2 | 2021-09-30

US20210302845A1

Method for process metrology

#3 | 2020-09-10

US20200284578A1

Substrate, metrology apparatus and associated methods for a lithographic process

#4 | 2020-05-07

US20200142324A1

Methods and patterning devices and apparatuses for measuring focus performance of a lithographic apparatus, device manufacturing method

#5 | 2019-11-21

US20190354024A1

Method of measuring a parameter of a device manufacturing process, metrology apparatus, substrate, target, device manufacturing system, and device manufacturing method

#6 | 2019-08-08

US20190242782A1

Method of determining an optimal focus height for a metrology apparatus

#7 | 2019-07-04

US20190204180A1

Method of processing data, method of obtaining calibration data

#8 | 2019-02-28

US20190063911A1

Substrate, metrology apparatus and associated methods for a lithographic process

InventorID:

2441292 ⎘