Paul DERWIN

City:

Eindhoven

Country:

Netherlands

Published Applications:

Last publication date:

2026-06-25

Top Assignees for applications by Paul DERWIN

The entities that hold a legal rights for patent applications filed by inventor DERWIN Paul:

Paul DERWIN from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:

METHOD FOR DETERMINING A SAMPLING SCHEME, A SEMICONDUCTOR SUBSTRATE MEASUREMENT APPARATUS, A LITHOGRAPHIC APPARATUS

SUB-FIELD CONTROL OF A LITHOGRAPHIC PROCESS AND ASSOCIATED APPARATUS

METHOD FOR DETERMINING A SAMPLING SCHEME, A SEMICONDUCTOR SUBSTRATE MEASUREMENT APPARATUS, A LITHOGRAPHIC APPARATUS

SUB-FIELD CONTROL OF A LITHOGRAPHIC PROCESS AND ASSOCIATED APPARATUS

Sub-field control of a lithographic process and associated apparatus

Mark position determination method

InventorID:

2441945 ⎘