Eindhoven
Netherlands
7
2024-02-01
The entities that hold a legal rights for patent applications filed by inventor RIJPSTRA Manouk:
Manouk RIJPSTRA from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:
METHOD OF DETERMINING AT LEAST A TARGET LAYOUT AND ASSOCIATED METROLOGY APPARATUS
#2 | 2024-01-11Metrology method and associated metrology and lithographic apparatuses
#3 | 2022-11-17COMPUTATIONAL METROLOGY BASED CORRECTION AND CONTROL
#4 | 2021-03-18Computational metrology based correction and control
#5 | 2020-08-27Lithographic method
#6 | 2020-03-12Lithographic method
#7 | 2019-03-28Lithographic method
2466394 ⎘