Inventor profile of:

Kai Esmark

City:

Neuried

Country:

Germany

Published Applications:

29

Last publication date:

2023-11-16

Top Assignees for applications by Kai Esmark

The entities that hold a legal rights for patent applications filed by inventor Esmark Kai:

Recent patent applications by Esmark Kai

Kai Esmark from Neuried, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2023-11-16
US20230369849A1
Electricity

ESD protection for multi-die integrated circuits (ICs) including integrated passive devices

#2 | 2020-07-30
US20200243507A1
Electricity

Silicon controlled rectifier and manufacturing method therefor

#3 | 2018-02-01
US20180033783A1
Electricity

Avalanche diode having an enhanced defect concentration level and method of making the same

#4 | 2016-11-17
US20160336308A1
Electricity

Integrated circuit including lateral insulated gate field effect transistor

#5 | 2016-06-16
US20160172849A1
Electricity

ESD/EOS DETECTION

#6 | 2016-04-21
US20160111413A1
Electricity

Avalanche diode having an enhanced defect concentration level and method of making the same

#7 | 2015-05-28
US20150144996A1
Electricity

Semiconductor ESD device and method of making same

#8 | 2014-10-02
US20140291808A1
Electricity

Avalanche diode having an enhanced defect concentration level and method of making the same

#9 | 2013-10-24
US20130277712A1
Electricity

Method of forming a semiconductor device including a silicon controlled rectifier

#10 | 2013-05-16
US20130122677A1
Electricity

Methods of forming electrostatic discharge devices

#11 | 2012-08-30
US20120218671A1
Electricity

Semiconductor ESD device and method of making same

#12 | 2011-12-15
US20110303948A1
Electricity

ESD and EMC optimized HV-MOS transistor

#13 | 2011-09-01
US20110210418A1
Electricity

Electrostatic discharge devices

#14 | 2010-12-23
US20100321843A1
Electricity

Semiconductor ESD device and method of making same

#15 | 2010-08-19
US20100208405A1
Electricity

Semiconductor ESD device and method of making same

#16 | 2010-05-13
US20100117116A1
Electricity

Integrated circuit arrangement with Shockley diode or thyristor and method for production and use of a thyristor

#17 | 2009-12-17
US20090309129A1
Electricity

Semiconductor ESD device and method of making same

#18 | 2009-11-19
US20090283859A1
Electricity

Integrated Circuit Arrangements With ESD-Resistant Capacitor and Corresponding Method of Production

#19 | 2009-11-19
US20090283810A1
Electricity

Integrated circuit arrangements with ESD-resistant capacitor and corresponding method of production

#20 | 2009-07-23
US20090185316A1
Electricity

Avalanche diode having an enhanced defect concentration level and method of making the same

#21 | 2008-07-31
US20080179624A1
Electricity

Semiconductor ESD device and method of making same

#22 | 2007-07-19
US20070165344A1
Physics

Identification of ESD and latch-up weak points in an integrated circuit

#23 | 2007-02-15
US20070034959A1
Electricity

Integrated circuit arrangements with ESD-resistant capacitor and corresponding method of production

#24 | 2006-11-23
US20060261412A1
Electricity

Process and electrostatic discharge protection device for the protection of a semiconductor circuit

#25 | 2006-10-26
US20060238937A1
Electricity

ESD protection device

#26 | 2006-03-16
US20060056121A1
Electricity

Circuit for protecting integrated circuits against electrostatic discharges

#27 | 2005-12-01
US20050263817A1
Electricity

Transistor comprising fill areas in the source drain and/or drain region

#28 | 2005-09-08
US20050195540A1
Electricity

ESD protective circuit with collector-current-controlled triggering for a monolithically integrated circuit

#29 | 2005-01-06
US20050003564A1
Electricity

Method for determining an ESD/latch-up strength of an integrated circuit

InventorID:

248086 ⎘