München
Germany
5
2023-08-10
The entities that hold a legal rights for patent applications filed by inventor SCHÜLER Bernhard:
Bernhard SCHÜLER from München, DE has applied for patents for these inventions. The list has both pending applications and granted patents:
METHOD OF IMAGING A SAMPLE WITH A CHARGED PARTICLE BEAM DEVICE, METHOD OF CALIBRATING A CHARGED PARTICLE BEAM DEVICE, AND CHARGED PARTICLE BEAM DEVICE
#2 | 2022-02-10Method of automatically focusing a charged particle beam on a surface region of a sample, method of calculating a converging set of sharpness values of images of a charged particle beam device and charged particle beam device for imaging a sample
#3 | 2021-12-02Method for automated critical dimension measurement on a substrate for display manufacturing, method of inspecting a large area substrate for display manufacturing, apparatus for inspecting a large area substrate for display manufacturing and method of operating thereof
#4 | 2021-08-12Method of automatically focusing a charged particle beam on a surface region of a sample, method of calculating a converging set of sharpness values of images of a charged particle beam device and charged particle beam device for imaging a sample
#5 | 2019-04-18Method of inspecting a sample with a charged particle beam device, and charged particle beam device
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