Inventor profile of:

Hung Chen

City:

Sunnyvale, California

Country:

United States

Published Applications:

13

Last publication date:

2020-03-19

Top Assignees for applications by Hung Chen

The entities that hold a legal rights for patent applications filed by inventor Chen Hung:

Recent patent applications by Chen Hung

Hung Chen from Sunnyvale, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2020-03-19
US20200086452A1
Performing operations; transporting

Chemical mechanical polishing apparatus and methods

#2 | 2017-10-19
US20170297163A1
Performing operations; transporting

Chemical mechanical polishing apparatus and methods

#3 | 2015-11-26
US20150336236A1
Performing operations; transporting

Conditioning of grooving in polishing pads

#4 | 2015-01-22
US20150021498A1
Performing operations; transporting

CHEMICAL MECHANICAL POLISHING RETAINING RING METHODS AND APPARATUS

#5 | 2014-10-23
US20140315473A1
Performing operations; transporting

Multi-disk chemical mechanical polishing pad conditioners and methods

#6 | 2014-10-16
US20140308813A1
Electricity

METHODS AND APPARATUS FOR A NON-CONTACT EDGE POLISHING MODULE USING ION MILLING

#7 | 2014-07-17
US20140199840A1
Electricity

CHEMICAL MECHANICAL POLISHING APPARATUS AND METHODS

#8 | 2013-10-31
US20130288578A1
Performing operations; transporting

Methods and apparatus for pre-chemical mechanical planarization buffing module

#9 | 2013-10-31
US20130288577A1
Performing operations; transporting

METHODS AND APPARATUS FOR ACTIVE SUBSTRATE PRECESSION DURING CHEMICAL MECHANICAL POLISHING

#10 | 2013-10-31
US20130283556A1
Human necessities

High stiffness, anti-slip scrubber brush assembly, high-stiffness mandrel, subassemblies, and assembly methods

#11 | 2013-10-31
US20130283553A1
Human necessities

ANTI-SLIP SCRUBBER BRUSH AND ASSEMBLY METHODS

#12 | 2013-05-16
US20130122788A1
Performing operations; transporting

Systems and methods for substrate polishing end point detection using improved friction measurement

#13 | 2013-05-16
US20130122782A1
Performing operations; transporting

Systems and methods for substrate polishing end point detection using improved friction measurement

InventorID:

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