Eitan Hajaj

City:

Tel Aviv

Country:

Israel

Published Applications:

Last publication date:

2023-07-06

Top Assignees for applications by Eitan Hajaj

The entities that hold a legal rights for patent applications filed by inventor Hajaj Eitan:

Eitan Hajaj from Tel Aviv, IL has applied for patents for these inventions. The list has both pending applications and granted patents:

Scanning overlay metrology using overlay targets having multiple spatial frequencies

Optical metrology utilizing short-wave infrared wavelengths

Metrology targets for high topography semiconductor stacks

Single cell scatterometry overlay targets

InventorID:

2495375 ⎘