Eindhoven
Netherlands
8
2025-11-27
The entities that hold a legal rights for patent applications filed by inventor KOOP Erik Johan:
Erik Johan KOOP from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:
METROLOGY METHOD AND ASSOCIATED METROLOGY DEVICE
#2 | 2020-06-18Method of measuring a parameter of a lithographic process, metrology apparatus
#3 | 2019-09-26Method of determining a height profile, a measurement system and a computer readable medium
#4 | 2019-07-11Methods for controlling lithographic apparatus, lithographic apparatus and device manufacturing method
#5 | 2018-07-26Methods for controlling lithographic apparatus, lithographic apparatus and device manufacturing method
#6 | 2018-06-21Method of measuring a property of a substrate, inspection apparatus, lithographic system and device manufacturing method
#7 | 2013-05-23Level sensor, a method for determining a height map of a substrate using a selected resolution, and a lithographic apparatus
#8 | 2009-08-13Method for determining exposure settings, lithographic exposure apparatus, computer program and data carrier
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