San Jose, California
United States
9
2026-06-18
The entities that hold a legal rights for patent applications filed by inventor Jiang Jun:
Jun Jiang from San Jose, US has applied for patents for these inventions. The list has both pending applications and granted patents:
CHARGED PARTICLE BEAM DETECTOR WITH ADAPTIVE DETECTION AREA FOR MULTIPLE FIELD OF VIEW SETTINGS
#2 | 2026-06-04SYSTEMS AND METHODS FOR PULSED VOLTAGE CONTRAST DETECTION AND CAPTURE OF CHARGING DYNAMICS
#3 | 2026-04-09PHOTO-ELECTRICAL EVOLUTION DEFECT INSPECTION
#4 | 2023-12-07Thermal-aided inspection by advanced charge controller module in a charged particle system
#5 | 2023-10-19SYSTEMS AND METHODS FOR PULSED VOLTAGE CONTRAST DETECTION AND CAPTURE OF CHARGING DYNAMICS
#6 | 2022-08-25PHOTO-ELECTRICAL EVOLUTION DEFECT INSPECTION
#7 | 2022-06-16Thermal-aided inspection by advanced charge controller module in a charged particle system
#8 | 2022-01-06Time-dependent defect inspection apparatus
#9 | 2020-03-05Time-dependent defect inspection apparatus
2666057 ⎘