Eindhoven
Netherlands
11
2024-11-14
The entities that hold a legal rights for patent applications filed by inventor ZHANG Yichen:
Yichen ZHANG from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:
COMPUTATIONAL METROLOGY BASED SAMPLING SCHEME
#2 | 2024-10-17A METHOD OF MONITORING A LITHOGRAPHIC PROCESS AND ASSOCIATED APPARATUSES
#3 | 2023-07-13Computational metrology based sampling scheme
#4 | 2022-10-20Determining lithographic matching performance
#5 | 2022-08-18Computational metrology
#6 | 2021-12-30Method in the manufacturing process of a device, a non-transitory computer-readable medium and a system configured to perform the method
#7 | 2021-08-19Methods using fingerprint and evolution analysis
#8 | 2021-06-24Computational metrology
#9 | 2020-11-26Computational metrology based sampling scheme
#10 | 2020-03-12Device manufacturing method
#11 | 2019-11-28Computational metrology
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