Phoenix, Arizona
United States
35
2026-01-01
The entities that hold a legal rights for patent applications filed by inventor WALL Marcel:
Marcel WALL from Phoenix, US has applied for patents for these inventions. The list has both pending applications and granted patents:
GLASS CORE EDGE TREATMENTS FOR HYBRID PANELS IN DEVICE PACKAGING
#2 | 2025-06-26PASSIVATION BOUNDARY DEFECTS FOR REDUCED LEAKAGE CURRENT CAPACITOR DIELECTRIC MATERIALS
#3 | 2025-01-02CARBON NANOFIBER CAPACITOR APPARATUS AND RELATED METHODS
#4 | 2025-01-02THROUGH GLASS VIAS WITH COMPLIANT LAYER FOR INTEGRATED CIRCUIT DEVICE PACKAGES
#5 | 2025-01-02HYBRID METALLIZATION SURFACES FOR INTEGRATED CIRCUIT PACKAGES
#6 | 2024-10-03GLASS-INTEGRATED INDUCTORS IN INTEGRATED CIRCUIT PACKAGES
#7 | 2024-10-03ELECTRONIC SUBSTRATES HAVING EMBEDDED INDUCTORS
#8 | 2024-09-26PHOTONIC INTEGRATED CIRCUIT PACKAGES AND METHODS OF MANUFACTURING THE SAME
#9 | 2024-07-04SUBSTRATE PACKAGE-INTEGRATED OXIDE CAPACITORS AND RELATED METHODS
#10 | 2024-06-27THIN FILM CAPACITOR (TFC) ARCHITECTURES FOR PACKAGE SUBSTRATES
#11 | 2024-06-27THIN FILM CAPACITORS (TFCS) IN ETCHED BACK DEEP VIA
#12 | 2024-06-27DIRECT PLATING OF COPPER ON DIELECTRICS FOR GLASS CORE PLATING
#13 | 2024-06-06METHOD OF FORMING A PACKAGE SUBSTRATE
#14 | 2024-01-04METALLIZATION SURFACE TREATMENT FOR INTEGRATED CIRCUIT PACKAGES
#15 | 2024-01-04SUBSTRATES HAVING ADHESION PROMOTOR LAYERS AND RELATED METHODS
#16 | 2024-01-04SILICIDE AND SILICON NITRIDE LAYERS BETWEEN A DIELECTRIC AND COPPER
#17 | 2024-01-04EDGE DELAMINATION AND CRACK PREVENTION METHODS FOR SINX AND TI-CU ENABLED PACKAGES
#18 | 2023-12-28ORGANIC ADHESION PROMOTOR FOR DIELECTRIC ADHESION TO A COPPER TRACE
#19 | 2023-10-05SURFACE FUNCTIONALIZATION OF SINX THIN FILM BY WET ETCHING FOR IMPROVED ADHESION OF METAL-DIELECTRIC FOR HSIO
#20 | 2023-10-05PLASMA-INDUCED SURFACE FUNCTIONALIZATION OF SINX THIN FILM FOR IMPROVED ADHESION OF METAL-DIELECTRIC FOR HSIO
#21 | 2023-10-05MODIFICATION OF SINX THIN FILM FOR IMPROVED ADHESION OF METAL-DIELECTRICS FOR HSIO PACKAGING
#22 | 2023-04-06THROUGH GLASS VIA WITH A METAL WALL
#23 | 2023-03-23CAPACITORS IN THROUGH GLASS VIAS
#24 | 2023-03-23METHODS AND APPARATUS TO IMPROVE ADHESION BETWEEN METALS AND DIELECTRICS IN CIRCUIT DEVICES
#25 | 2022-09-15Dielectric-to-metal adhesion promotion material
#26 | 2022-03-31Selectively roughened copper architectures for low insertion loss conductive features
#27 | 2022-03-24Electronic substrates having embedded inductors
#28 | 2022-01-13ELECTROLESS PLATING PROCESS
#29 | 2021-03-25MULTIPLE LAYER COPPER SEEDING
#30 | 2020-10-01COPPER INTERFACE FEATURES FOR HIGH SPEED INTERCONNECT APPLICATIONS
#31 | 2020-10-01CONTROLLED ORGANIC LAYERS TO ENHANCE ADHESION TO ORGANIC DIELECTRICS AND PROCESS FOR FORMING SUCH
#32 | 2020-10-01Hybrid fine line spacing architecture for bump pitch scaling
#33 | 2020-08-06Selective metal deposition by patterning direct electroless metal plating
#34 | 2019-12-26Package architecture with improved via drill process and method for forming such package
#35 | 2019-10-17Interfacial layer for high resolution lithography (HRL) and high speed input/output (IO or I/O) architectures
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