Eindhoven
Netherlands
14
2025-12-25
The entities that hold a legal rights for patent applications filed by inventor BATISTAKIS Chrysostomos:
Chrysostomos BATISTAKIS from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:
SYSTEM AND METHOD FOR GENERATING PREDICTIVE IMAGES FOR WAFER INSPECTION USING MACHINE LEARNING
#2 | 2025-06-19METHODS OF METROLOGY AND ASSOCIATED DEVICES
#3 | 2025-05-08METHODS OF METROLOGY
#4 | 2025-03-27TRAINING A MODEL TO GENERATE PREDICTIVE DATA
#5 | 2024-11-07METHOD FOR DETERMINING A STOCHASTIC METRIC RELATING TO A LITHOGRAPHIC PROCESS
#6 | 2024-02-22DATA-DRIVEN PREDICTION AND IDENTIFICATION OF FAILURE MODES BASED ON WAFER-LEVEL ANALYSIS AND ROOT CAUSE ANALYSIS FOR SEMICONDUCTOR PROCESSING
#7 | 2024-02-15APPARATUS AND METHOD FOR DETERMINING THREE DIMENSIONAL DATA BASED ON AN IMAGE OF A PATTERNED SUBSTRATE
#8 | 2024-01-18MACHINE LEARNING BASED IMAGE GENERATION OF AFTER-DEVELOPMENT OR AFTER-ETCH IMAGES
#9 | 2023-10-19Method for predicting resist deformation
#10 | 2023-07-13Systems and methods for predicting layer deformation
#11 | 2023-03-16METHOD FOR PREDICTING STOCHASTIC CONTRIBUTORS
#12 | 2022-11-24SYSTEM AND METHOD FOR GENERATING PREDICTIVE IMAGES FOR WAFER INSPECTION USING MACHINE LEARNING
#13 | 2022-03-10Method for predicting resist deformation
#14 | 2020-10-08Systems and methods for predicting layer deformation
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