Gilroy, California
United States
19
2025-07-03
The entities that hold a legal rights for patent applications filed by inventor Erickson Blake:
Blake Erickson from Gilroy, US has applied for patents for these inventions. The list has both pending applications and granted patents:
SUBSTRATE MEASUREMENT SUBSYSTEM
#2 | 2024-10-31SMART CAMERA SUBSTRATE
#3 | 2024-03-21IN-SITU ETCH MATERIAL SELECTIVITY DETECTION SYSTEM
#4 | 2023-10-26Smart camera substrate
#5 | 2023-10-12Integrated substrate measurement system to improve manufacturing process performance
#6 | 2023-08-17SPATIAL OPTICAL EMISSION SPECTROSCOPY FOR ETCH UNIFORMITY
#7 | 2023-06-01Multiple reflectometry for measuring etch parameters
#8 | 2023-03-02DETERMINING SUBSTRATE PROFILE PROPERTIES USING MACHINE LEARNING
#9 | 2022-11-03Multiple reflectometry for measuring etch parameters
#10 | 2022-10-20Spatial optical emission spectroscopy for etch uniformity
#11 | 2022-08-25Smart camera substrate
#12 | 2022-03-17Smart camera substrate
#13 | 2022-03-03DETECTING AND CORRECTING SUBSTRATE PROCESS DRIFT USING MACHINE LEARNING
#14 | 2022-02-17In-situ etch material selectivity detection system
#15 | 2022-02-17IN-SITU ETCH RATE AND ETCH RATE UNIFORMITY DETECTION SYSTEM
#16 | 2022-01-27Substrate measurement subsystem
#17 | 2022-01-27Integrated substrate measurement system to improve manufacturing process performance
#18 | 2022-01-27DETERMINING SUBSTRATE PROFILE PROPERTIES USING MACHINE LEARNING
#19 | 2020-10-29PLASMA EMISSION MONITORING SYSTEM WITH CROSS-DISPERSION GRATING
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