Eindhoven
Netherlands
15
2025-05-08
The entities that hold a legal rights for patent applications filed by inventor BASTANI Vahid:
Vahid BASTANI from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:
METHODS OF METROLOGY
#2 | 2024-12-05METHOD OF DETERMINING A PERFORMANCE PARAMETER DISTRIBUTION
#3 | 2024-10-17A METHOD OF MONITORING A LITHOGRAPHIC PROCESS AND ASSOCIATED APPARATUSES
#4 | 2024-03-21METHOD TO PREDICT METROLOGY OFFSET OF A SEMICONDUCTOR MANUFACTURING PROCESS
#5 | 2023-10-26METHOD AND APPARATUS FOR IDENTIFYING CONTAMINATION IN A SEMICONDUCTOR FAB
#6 | 2023-10-05METHOD FOR CLASSIFYING SEMICONDUCTOR WAFERS
#7 | 2023-05-18CONFIGURATION OF AN IMPUTER MODEL
#8 | 2022-11-03METHOD AND APPARATUS FOR DETERMINING FEATURE CONTRIBUTION TO PERFORMANCE
#9 | 2022-10-27METHOD FOR DETERMINING CONTRIBUTION TO A FINGERPRINT
#10 | 2022-09-15METHOD AND APPARATUS FOR LITHOGRAPHIC PROCESS PERFORMANCE DETERMINATION
#11 | 2021-05-27Maintaining a set of process fingerprints
#12 | 2021-04-22Method to label substrates based on process parameters
#13 | 2021-01-07Method for determining contribution to a fingerprint
#14 | 2020-11-12Method to label substrates based on process parameters
#15 | 2019-09-05Method for determining contribution to a fingerprint
2905435 ⎘