Inventor profile of:

Robert Chau

City:

Beaverton, Oregon

Country:

United States

Published Applications:

65

Last publication date:

2019-08-08

Top Assignees for applications by Robert Chau

The entities that hold a legal rights for patent applications filed by inventor Chau Robert:

Recent patent applications by Chau Robert

Robert Chau from Beaverton, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2019-08-08
US20190244936A1
Electricity

Group III-N transistors for system on chip (SOC) architecture integrating power management and radio frequency circuits

#2 | 2019-07-25
US20190229022A1
Electricity

CMOS implementation of germanium and III-V nanowires and nanoribbons in gate-all-around architecture

#3 | 2019-05-30
US20190165106A1
Electricity

Group III-N nanowire transistors

#4 | 2017-10-05
US20170288022A1
Electricity

Group III-N nanowire transistors

#5 | 2017-09-14
US20170263708A1
Electricity

High voltage field effect transistors

#6 | 2017-08-10
US20170229354A1
Electricity

CMOS implementation of germanium and III-V nanowires and nanoribbons in gate-all-around architecture

#7 | 2017-07-20
US20170207310A1
Electricity

Self-aligned gate last III-N transistors

#8 | 2016-11-24
US20160343844A1
Electricity

High electron mobility transistor (HEMT) and method of fabrication

#9 | 2016-10-27
US20160315153A1
Electricity

Group III-N nanowire transistors

#10 | 2016-03-17
US20160079359A1
Electricity

High voltage field effect transistors

#11 | 2016-03-03
US20160064512A1
Electricity

Group III-N nanowire transistors

#12 | 2015-11-12
US20150325481A1
Electricity

CMOS implementation of germanium and III-V nanowires and nanoribbons in gate-all-around architecture

#13 | 2013-11-28
US20130313520A1
Electricity

Apparatus and methods for improving parallel conduction in a quantum well device

#14 | 2013-11-21
US20130307513A1
Electricity

High voltage field effect transistors

#15 | 2013-10-24
US20130279145A1
Electricity

Group III-N nanowire transistors

#16 | 2013-10-24
US20130277683A1
Electricity

Non-planar III-N transistor

#17 | 2013-10-17
US20130271208A1
Electricity

Group III-N transistors for system on chip (SOC) architecture integrating power management and radio frequency circuits

#18 | 2013-10-17
US20130270512A1
Electricity

CMOS implementation of germanium and III-V nanowires and nanoribbons in gate-all-around architecture

#19 | 2013-06-20
US20130153965A1
Electricity

Strained transistor integration for CMOS

#20 | 2012-12-27
US20120326123A1
Electricity

Apparatus and methods for improving parallel conduction in a quantum well device

#21 | 2012-03-29
US20120074386A1
Electricity

Non-planar quantum well device having interfacial layer and method of forming same

#22 | 2012-02-09
US20120032146A1
Electricity

Apparatus and methods for improving parallel conduction in a quantum well device

#23 | 2011-08-04
US20110186912A1
Electricity

Transistor gate electrode having conductor material layer

#24 | 2011-02-17
US20110039377A1
Electricity

Semiconductor on insulator

#25 | 2011-01-27
US20110018031A1
Electricity

Transistor gate electrode having conductor material layer

#26 | 2010-11-11
US20100285279A1
Electricity

Methods of forming nanodots using spacer patterning techniques and structures formed thereby

#27 | 2010-09-16
US20100230658A1
Electricity

Apparatus and methods for improving parallel conduction in a quantum well device

#28 | 2010-07-01
US20100164102A1
Electricity

Isolated Germanium nanowire on Silicon fin

#29 | 2010-02-25
US20100044754A1
Electricity

Strained transistor integration for CMOS

#30 | 2010-02-18
US20100038717A1
Electricity

Semiconductor on insulator apparatus

#31 | 2009-12-24
US20090315076A1
Electricity

Transistor gate electrode having conductor material layer

#32 | 2009-04-02
US20090085082A1
Electricity

CONTROLLED INTERMIXING OF HFO2 AND ZRO2 DIELECTRICS ENABLING HIGHER DIELECTRIC CONSTANT AND REDUCED GATE LEAKAGE

#33 | 2009-01-06
US10194506
-

Process for ultra-thin body SOI devices that incorporate EPI silicon tips and article made thereby

#34 | 2008-12-11
US20080303116A1
Electricity

Semiconductor on insulator apparatus

#35 | 2008-10-02
US20080237672A1
Electricity

High density memory

#36 | 2008-09-23
US10222173
-

Semiconductor on insulator apparatus and method

#37 | 2008-09-04
US20080210927A1
Electricity

Buffer architecture formed on a semiconductor wafer

#38 | 2008-07-17
US20080169512A1
Electricity

Non-planar pMOS structure with a strained channel region and an integrated strained CMOS flow

#39 | 2008-07-03
US20080157162A1
Electricity

Method of combining floating body cell and logic transistors

#40 | 2008-06-26
US20080151603A1
Physics

Transistor for non volatile memory devices having a carbon nanotube channel and electrically floating quantum dots in its gate dielectric

#41 | 2008-04-10
US20080085580A1
Electricity

Methods for uniform doping of non-planar transistor structures

#42 | 2008-01-17
US20080014730A1
Electricity

Method and apparatus to prevent lateral oxidation in a transistor utilizing an ultra thin oxygen-diffusion barrier

#43 | 2007-11-15
US20070262389A1
Electricity

TRI-GATE TRANSISTORS AND METHODS TO FABRICATE SAME

#44 | 2007-07-26
US20070170464A1
Electricity

Transistor gate electrode having conductor material layer

#45 | 2007-05-24
US20070114593A1
Physics

Transistor for non volatile memory devices having a carbon nanotube channel and electrically floating quantum dots in its gate dielectric

#46 | 2007-03-01
US20070045753A1
Electricity

Semiconductor device having a metal gate electrode formed on an annealed high-k gate dielectric layer

#47 | 2006-07-20
US20060157794A1
Electricity

Non-planar MOS structure with a strained channel region

#48 | 2006-07-20
US20060157687A1
Electricity

Non-planar MOS structure with a strained channel region

#49 | 2006-05-16
US10324305
-

Pre-etch implantation damage for the removal of thin film layers

#50 | 2006-03-23
US20060063332A1
Electricity

U-gate transistors and methods of fabrication

#51 | 2006-02-16
US20060033095A1
Electricity

Non-planar pMOS structure with a strained channel region and an integrated strained CMOS flow

#52 | 2006-02-14
US10230944
-

Metal-gate electrode for CMOS transistor applications

#53 | 2006-01-26
US20060017122A1
Electricity

Metalgate electrode for PMOS transistor

#54 | 2005-12-13
US10463080
-

Double-gate transistor with enhanced carrier mobility

#55 | 2005-12-08
US20050272187A1
Electricity

Process for ultra-thin body SOI devices that incorporate EPI silicon tips and article made thereby

#56 | 2005-07-21
US20050158974A1
Electricity

Semiconductor device having a metal gate electrode

#57 | 2005-07-21
US20050158970A1
Electricity

Tri-gate transistors and methods to fabricate same

#58 | 2005-07-07
US20050145944A1
Electricity

Transistor gate electrode having conductor material layer

#59 | 2005-06-30
US20050142766A1
Electricity

Method of fabricating an ultra-narrow channel semiconductor device

#60 | 2005-06-23
US20050136584A1
Electricity

Strained transistor integration for CMOS

#61 | 2005-06-09
US20050124125A1
Electricity

Non-silicon semiconductor and high-k gate dielectric metal oxide semiconductor field effect transistors

#62 | 2005-05-31
US10081992
-

Non-silicon semiconductor and high-k gate dielectric metal oxide semiconductor field effect transistors

#63 | 2005-05-10
US10431166
-

Method for making a semiconductor device having a metal gate electrode

#64 | 2005-02-10
US20050032318A1
Electricity

Method for making a semiconductor device having a high-k gate dielectric

#65 | 2005-02-03
US20050026333A1
Electricity

Method of fabricating an ultra-narrow channel semiconductor device

InventorID:

294286 ⎘