Mark I. Gardner

ELECTRICAL ENERGY PRODUCED BY ROTATING MAGNETS

CONTACTLESS WAFER POSITIONING CARRIER DESIGN

METAL RECESS DEPTH MEASUREMENTS BY CAPACITOR TEST STRUCTURE

WAFER OVERLAY REGISTRATION IN HYBRID BONDING

REFLECTING NON-PLANAR SURFACES INTEGRATED WITH LASER SCAN FOR POSEIDON TOOL INTEGRATION

APPARATUS AND METHOD FOR DETERMINING THE SURFACE PROFILE OF A SEMICONDUCTOR SUBSTRATE USING A LASER SCANNING TECHNIQUE

METHOD OF HYBRID BONDING USING DIE DISTRIBUTION MODEL

WAFER SUPPORT FOR MEASURING WAFER GEOMETRY

DEVICE AND METHOD FOR DETERMINING WAFER BOW

CONTACTLESS CAPACITIVE MEASUREMENT TOOL WITH IMPROVED THROUGHPUT AND ACCURACY

DEVICE AND METHOD FOR DETERMINING WAFER BOW

SEMICONDUCTOR DEVICES WITH VERTICAL TRANSISTORS AND FERROELECTRIC CAPACITORS

METHODS AND DEVICES FOR VERTICAL CONNECTION WITH INTERNAL EPITAXIAL STRUCTURE

FORKSHEET SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME

METHOD FOR STACKING INTEGRATED CIRCUIT WAFERS AND DIES

Multiple nano layer transistor layers with different transistor architectures for improved circuit layout and performance