Middletown, Connecticut
United States
48
2024-02-15
The entities that hold a legal rights for patent applications filed by inventor de Groot Peter J.:
Peter J. de Groot from Middletown, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Interometric optical system
#2 | 2019-08-29Metrology of multi-layer stacks
#3 | 2018-06-28Surface topography apparatus and method
#4 | 2016-02-18Method and system for determining information about a transparent optical element comprising a lens portion and a plane parallel portion
#5 | 2016-02-18Optical evaluation of lenses and lens molds
#6 | 2016-02-18Calibration of scanning interferometers
#7 | 2015-10-15Double pass interferometric encoder system
#8 | 2015-07-09Measuring topography of aspheric and other non-flat surfaces
#9 | 2015-02-12Interferometry employing refractive index dispersion broadening of interference signals
#10 | 2015-02-12Interferometric heterodyne optical encoder system
#11 | 2015-01-01COHERENCE SCANNING INTERFEROMETRY USING PHASE SHIFTED INTERFEROMETRTY SIGNALS
#12 | 2014-02-20Interferometric encoder systems
#13 | 2013-06-20Low coherence interferometry with scan error correction
#14 | 2012-08-02Interferometric heterodyne optical encoder system
#15 | 2012-07-05Interferometric encoder systems
#16 | 2012-03-22Interferometric methods for metrology of surfaces, films and underresolved structures
#17 | 2011-10-20Interferometric encoder systems
#18 | 2011-01-13Equal-path interferometer
#19 | 2010-05-27Interferometric systems and methods featuring spectral analysis of unevenly sampled data
#20 | 2010-03-11Methods and systems for interferometric analysis of surfaces and related applications
#21 | 2009-04-16Methods and systems for interferometric analysis of surfaces and related applications
#22 | 2009-01-15Interferometry method for ellipsometry, reflectometry, and scatterometry measurements, including characterization of thin film structures
#23 | 2008-07-31Scanning interferometry for thin film thickness and surface measurements
#24 | 2008-03-20Methods and systems for interferometric analysis of surfaces and related applications
#25 | 2008-03-13Profiling complex surface structures using scanning interferometry
#26 | 2007-10-25Interferometry method for ellipsometry, reflectometry, and scatterometry measurements, including characterization of thin film structures
#27 | 2007-09-18Profiling complex surface structures using scanning interferometry
#28 | 2007-08-30Cyclic camera
#29 | 2007-05-03Profiling complex surface structures using height scanning interferometry
#30 | 2007-04-12Interferometry method for ellipsometry, reflectometry, and scatterometry measurements, including characterization of thin film structures
#31 | 2006-11-21Interferometry method for ellipsometry, reflectometry, and scatterometry measurements, including characterization of thin film structures
#32 | 2006-09-05Scanning interferometry
#33 | 2006-08-24Interferometry systems and methods using spatial carrier fringes
#34 | 2006-06-27Interferometry method and apparatus for producing lateral metrology images
#35 | 2006-06-01Measurement of complex surface shapes using a spherical wavefront
#36 | 2006-05-16Interferometer having a coupled cavity geometry for use with an extended source
#37 | 2006-05-09Method and apparatus for writing apodized patterns
#38 | 2006-04-18Measurement of complex surface shapes using a spherical wavefront
#39 | 2006-04-18Apparatus and method for mechanical phase shifting interferometry
#40 | 2006-03-14Interferometric optical systems having simultaneously scanned optical path length and focus
#41 | 2006-01-24Phase gap analysis for scanning interferometry
#42 | 2005-06-21Optical surface profiling systems
#43 | 2005-04-28Scanning interferometry for thin film thickness and surface measurements
#44 | 2005-04-14Surface profiling using an interference pattern matching template
#45 | 2005-04-14Methods and systems for interferometric analysis of surfaces and related applications
#46 | 2005-04-07Profiling complex surface structures using scanning interferometry
#47 | 2005-03-31Triangulation methods and systems for profiling surfaces through a thin film coating
#48 | 2005-03-17Low coherence grazing incidence interferometry for profiling and tilt sensing
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