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Inventor profile of:

Tetsuya Watanabe

City:

Honjo

Country:

Japan

Published Applications:

13

Last publication date:

2012-01-05

Top Assignees for applications by Tetsuya Watanabe

The entities that hold a legal rights for patent applications filed by inventor Watanabe Tetsuya:

HITACHI HIGH-TECHNOLOGIES CORPORATION 9 Tokyo, Japan
HITACHI, LTD. 7 Tokyo, Japan
Hitachi High-Tech Electronics Engineering Co., Ltd. 2 Tokyo, Japan
Hitachi High Technologies Corporation 1 , Japan
Hitachi, LTD 1 , Japan
Hitachi Electronics Engineering Co., Ltd. 1 Tokyo, Japan

Recent patent applications by Watanabe Tetsuya

Tetsuya Watanabe from Honjo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2012-01-05

US20120002196A1

System for monitoring foreign particles, process processing apparatus and method of electronic commerce

#2 | 2009-07-09

US20090177413A1

System for monitoring foreign particles, process processing apparatus and method of electronic commerce

#3 | 2007-11-15

US20070265797A1

Method and its apparatus for inspecting particles or defects of a semiconductor device

#4 | 2007-07-19

US20070165212A1

System for monitoring foreign particles, process processing apparatus and method of electronic commerce

#5 | 2007-06-28

US20070146697A1

Performing operations; transporting

Apparatus and method for testing defects

#6 | 2007-06-28

US20070146696A1

Performing operations; transporting

Apparatus and method for testing defects

#7 | 2007-03-27

US10630734

System for monitoring foreign particles, process processing apparatus and method of electronic commerce

#8 | 2006-05-02

US10170378

Apparatus and method for testing defects

#9 | 2006-02-09

US20060030060A1

Performing operations; transporting

Apparatus and method for testing defects

#10 | 2006-02-09

US20060030059A1

Performing operations; transporting

Apparatus and method for testing defects

#11 | 2005-12-01

US20050264798A1

Method and its apparatus for inspecting particles or defects of a semiconductor device

#12 | 2005-09-13

US10656221

Inspecting method and apparatus for repeated micro-miniature patterns

#13 | 2005-08-30

US10230416

Method and its apparatus for inspecting particles or defects of a semiconductor device

InventorID:

3064428 ⎘