Tokyo
Japan
5
2025-05-29
The entities that hold a legal rights for patent applications filed by inventor Takasu Hiromitsu:
Hiromitsu Takasu from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:
TEST ARRANGEMENT FOR OVER-THE-AIR TESTING AN ANGLED DEVICE UNDER TEST USING A CARRIER STRUCTURE WITH AN OPENING
#2 | 2025-05-29TEST ARRANGEMENT FOR OVER-THE-AIR TESTING AN ANGLED DEVICE UNDER TEST IN A DEVICE-UNDER-TEST SOCKET
#3 | 2025-05-29TEST ARRANGEMENT FOR OVER-THE-AIR TESTING AN ANGLED DEVICE UNDER TEST THAT IS TILTED RELATIVE TO A SURFACE OF A CARRIER STRUCTURE
#4 | 2012-04-12Connector and semiconductor testing device including the connector
#5 | 2007-01-04Semiconductor test apparatus and interface plate
3140970 ⎘