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Inventor profile of:

Jun MOCHIZUKI

City:

Nirasaki

Country:

Japan

Published Applications:

Last publication date:

2022-10-06

Top Assignees for applications by Jun MOCHIZUKI

The entities that hold a legal rights for patent applications filed by inventor MOCHIZUKI Jun:

TOKYO ELECTRON LIMITED 10 Tokyo, Japan
TOKYO ELECTRON LIMITED 4 Minato-ku, Japan
Tokyo Electron Limited 2 , Japan

Recent patent applications by MOCHIZUKI Jun

Jun MOCHIZUKI from Nirasaki, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2022-10-06

US20220316953A1

Physics

MOUNTING TABLE, TEST APPARATUS, AND TEMPERATURE CALIBRATION METHOD

#2 | 2021-09-30

US20210305761A1

Electricity

Pogo block within the intermediate connection member of an inspection system

#3 | 2020-07-02

US20200209072A1

Physics

Temperature measurement member, inspection apparatus, and temperature measurement method

#4 | 2020-04-16

US20200116756A1

Physics

Intermediate connection member and inspection apparatus

#5 | 2015-08-06

US20150219687A1

Physics

Method of contacting substrate with probe card

#6 | 2012-05-31

US20120132615A1

Physics

Manufacturing method of probe card

#7 | 2011-02-24

US20110043232A1

Physics

Contact structure for inspection

#8 | 2009-06-11

US20090146673A1

Physics

Manufacturing method of probe card and the probe card

#9 | 2008-08-14

US20080191720A1

Physics

Multilayer substrate and probe card

#10 | 2007-12-20

US20070290699A1

Physics

Probe card

#11 | 2007-12-20

US20070290698A1

Physics

Probe card

#12 | 2007-08-09

US20070182431A1

Physics

Probe card and probe device for inspection of a semiconductor device

InventorID:

3178396 ⎘