Sunnyvale, California
United States
16
2022-08-25
The entities that hold a legal rights for patent applications filed by inventor Veldman Andrei:
Andrei Veldman from Sunnyvale, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Full beam metrology for x-ray scatterometry systems
#2 | 2021-07-22Optical metrology tool equipped with modulated illumination sources
#3 | 2020-12-17Visualization of three-dimensional semiconductor structures
#4 | 2020-09-24Full beam metrology for x-ray scatterometry systems
#5 | 2020-08-27Visualization of three-dimensional semiconductor structures
#6 | 2020-03-12Phase revealing optical and X-ray semiconductor metrology
#7 | 2019-06-27Optical metrology tool equipped with modulated illumination sources
#8 | 2019-05-02Optimizing computational efficiency by multiple truncation of spatial harmonics
#9 | 2018-11-15Methods and systems for characterization of an x-ray beam with high spatial resolution
#10 | 2018-04-26Hybrid metrology for patterned wafer characterization
#11 | 2018-04-19Full beam metrology for X-ray scatterometry systems
#12 | 2017-01-19Optical metrology tool equipped with modulated illumination sources
#13 | 2016-08-25Optimizing computational efficiency by multiple truncation of spatial harmonics
#14 | 2015-04-30Methods and apparatus for measuring semiconductor device overlay using X-ray metrology
#15 | 2014-11-27Metrology system optimization for parameter tracking
#16 | 2013-07-04Optical metrology tool equipped with modulated illumination sources
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