Ryuji OHNO

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2012-11-22

Top Assignees for applications by Ryuji OHNO

The entities that hold a legal rights for patent applications filed by inventor OHNO Ryuji:

Ryuji OHNO from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

Method of evaluating silicon wafer and method of manufacturing silicon wafer

InventorID:

3298572 ⎘