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Inventor profile of:

Tadashi Obikane

City:

Nirasaki

Country:

Japan

Published Applications:

8

Last publication date:

2011-05-12

Top Assignees for applications by Tadashi Obikane

The entities that hold a legal rights for patent applications filed by inventor Obikane Tadashi:

  • TOKYO ELECTRON LIMITED 8 Tokyo, Japan
  • TOKYO ELECTRON LIMITED 1 Minato-ku, Japan

Recent patent applications by Obikane Tadashi

Tadashi Obikane from Nirasaki, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2011-05-12
US20110107858A1
Physics

Probe apparatus and substrate transfer method

#2 | 2010-02-18
US20100040441A1
Electricity

FOUP opening/closing device and probe apparatus

#3 | 2009-10-29
US20090267626A1
Physics

Probing apparatus and probing method

#4 | 2008-11-27
US20080290886A1
Physics

Each inspection units of a probe apparatus is provided with an imaging unit to take an image of a wafer

#5 | 2008-11-20
US20080284455A1
Physics

Probe apparatus

#6 | 2008-10-02
US20080240891A1
Electricity

Transfer and inspection devices of object to be inspected

#7 | 2007-11-15
US20070264104A1
Electricity

Processing apparatus

#8 | 2007-11-15
US20070262783A1
Physics

Probing apparatus and probing method

InventorID:

3377945 ⎘

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