David M. Wu

City:

Pflugerville, Texas

Country:

United States

Published Applications:

Last publication date:

2011-06-30

Top Assignees for applications by David M. Wu

The entities that hold a legal rights for patent applications filed by inventor Wu David M.:

David M. Wu from Pflugerville, US has applied for patents for these inventions. The list has both pending applications and granted patents:

Scan architecture and design methodology yielding significant reduction in scan area and power overhead

Common test logic for multiple operation modes

InventorID:

3418403 ⎘