Campbell, California
United States
5
2012-03-13
The entities that hold a legal rights for patent applications filed by inventor Maher Chris:
Chris Maher from Campbell, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Computer-implemented methods, carrier media, and systems for creating a defect sample for use in selecting one or more parameters of an inspection recipe
#2 | 2011-09-15Monitoring of time-varying defect classification performance
#3 | 2009-12-03Methods and systems for generating information to be used for selecting values for one or more parameters of a detection algorithm
#4 | 2009-03-26Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functions
#5 | 2008-11-13Computer-implemented methods, computer-readable media, and systems for identifying one or more optical modes of an inspection system as candidates for use in inspection of a layer of a wafer
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