Los Altos, California
United States
5
2022-04-14
The entities that hold a legal rights for patent applications filed by inventor Liu Wei:
Wei Liu from Los Altos, US has applied for patents for these inventions. The list has both pending applications and granted patents:
METHOD AND APPARATUS FOR DESIGN OF A METROLOGY TARGET
#2 | 2016-05-26Metrology method and apparatus
#3 | 2015-07-02Method and apparatus for design of a metrology target
#4 | 2015-02-26Correction for flare effects in lithography system
#5 | 2013-07-18Correction for flare effects in lithography system
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