Inventor profile of:

Henry Megens

City:

Eindhoven

Country:

Netherlands

Published Applications:

12

Last publication date:

2011-06-02

Top Assignees for applications by Henry Megens

The entities that hold a legal rights for patent applications filed by inventor Megens Henry:

Recent patent applications by Megens Henry

Henry Megens from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2011-06-02
US20110128520A1
Physics

Alignment systems and methods for lithographic systems

#2 | 2008-07-31
US20080180668A1
Physics

Marker structure for optical alignment of a substrate, a substrate including such a marker structure, an alignment method for aligning to such a marker structure, and a lithographic projection apparatus

#3 | 2008-02-12
US10665360
-

Marker structure for optical alignment of a substrate, a substrate including such a marker structure, an alignment method for aligning to such a marker structure, and a lithographic projection apparatus

#4 | 2007-12-13
US20070284697A1
Electricity

Marker for alignment of non-transparent gate layer, method for manufacturing such a marker, and use of such a marker in a lithographic apparatus

#5 | 2007-08-02
US20070176128A1
Physics

Alignment systems and methods for lithographic systems

#6 | 2006-05-04
US20060091330A1
Physics

Alignment systems and methods for lithographic systems

#7 | 2006-04-27
US20060086910A1
Physics

Alignment systems and methods for lithographic systems

#8 | 2006-04-20
US20060081792A1
Physics

Alignment systems and methods for lithographic systems

#9 | 2006-04-20
US20060081791A1
Physics

Alignment systems and methods for lithographic systems

#10 | 2006-04-20
US20060081790A1
Physics

Alignment systems and methods for lithographic systems

#11 | 2006-01-05
US20060003540A1
Electricity

Marker for alignment of non-transparent gate layer, method for manufacturing such a marker, and use of such a marker in a lithographic apparatus

#12 | 2005-09-01
US20050189502A1
Physics

Alignment systems and methods for lithographic systems

InventorID:

3541495 ⎘