Inventor profile of:

Mark VISOKAY

City:

Richardson, Texas

Country:

United States

Published Applications:

18

Last publication date:

2010-05-06

Top Assignees for applications by Mark VISOKAY

The entities that hold a legal rights for patent applications filed by inventor VISOKAY Mark:

Recent patent applications by VISOKAY Mark

Mark VISOKAY from Richardson, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2010-05-06
US20100109089A1
Electricity

MOS device and process having low resistance silicide interface using additional source/drain implant

#2 | 2009-03-05
US20090057759A1
Electricity

MOS device and process having low resistance silicide interface using additional source/drain implant

#3 | 2008-11-27
US20080293193A1
Electricity

USE OF LOW TEMPERATURE ANNEAL TO PROVIDE LOW DEFECT GATE FULL SILICIDATION

#4 | 2008-11-27
US20080290428A1
Electricity

USE OF ALLOYS TO PROVIDE LOW DEFECT GATE FULL SILICIDATION

#5 | 2008-11-27
US20080290427A1
Electricity

Use of dopants to provide low defect gate full silicidation

#6 | 2007-08-07
US10860341
-

Methods for forming and integrated circuit structures containing enhanced-surface-area conductive layers

#7 | 2007-08-07
US9590795
-

Methods for forming and integrated circuit structures containing ruthenium and tungsten containing layers

#8 | 2007-03-15
US20070059872A1
Electricity

Methods for fabricating MOS transistor gates with doped silicide

#9 | 2006-11-02
US20060244045A1
Electricity

MOS Transistor Gates with Doped Silicide and Methods for Making the Same

#10 | 2006-07-13
US20060154382A1
Electricity

Capacitor with high dielectric constant materials and method of making

#11 | 2006-07-04
US10338310
-

Control of high-k gate dielectric film composition profile for property optimization

#12 | 2006-05-02
US10850664
-

Integrated circuits with rhodium-rich structures

#13 | 2006-05-02
US9904112
-

Capacitor with high dielectric constant materials and method of making

#14 | 2006-04-13
US20060076597A1
Electricity

Methods for forming and integrated circuit structures containing ruthenium and tungsten containing layers

#15 | 2005-04-14
US20050079655A1
Electricity

Reduction of dopant loss in a gate structure

#16 | 2005-03-31
US20050070062A1
Electricity

MOS transistor gates with doped silicide and methods for making the same

#17 | 2005-03-22
US10234581
-

Integrated capacitors fabricated with conductive metal oxides

#18 | 2005-03-17
US20050059198A1
Electricity

Metal gate MOS transistors and methods for making the same

InventorID:

3607503 ⎘