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Inventor profile of:

John Dunklee

City:

Tigard, Oregon

Country:

United States

Published Applications:

Last publication date:

2010-05-06

Top Assignees for applications by John Dunklee

The entities that hold a legal rights for patent applications filed by inventor Dunklee John:

Cascade Microtech, Inc. 29 Beaverton, OR United States

Recent patent applications by Dunklee John

John Dunklee from Tigard, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2010-05-06

US20100109695A1

Electricity

Chuck for holding a device under test

#2 | 2009-06-18

US20090153167A1

Physics

Chuck for holding a device under test

#3 | 2009-02-17

US10829869

Chuck for holding a device under test

#4 | 2008-07-03

US20080157796A1

Physics

Chuck with integrated wafer support

#5 | 2008-03-06

US20080054929A1

Physics

Shielded probe for testing a device under test

#6 | 2008-03-06

US20080054923A1

Physics

Shielded probe for testing a device under test

#7 | 2008-03-06

US20080054885A1

Electricity

Chuck for holding a device under test

#8 | 2008-03-06

US20080054884A1

Electricity

Chuck for holding a device under test

#9 | 2008-03-06

US20080054883A1

Electricity

Chuck for holding a device under test

#10 | 2008-02-28

US20080048692A1

Physics

Shielded probe with low contact resistance for testing a device under test

#11 | 2008-02-28

US20080048648A1

Electricity

Chuck for holding a device under test

#12 | 2008-02-28

US20080048647A1

Electricity

Chuck for holding a device under test

#13 | 2008-02-21

US20080042674A1

Electricity

Chuck for holding a device under test

#14 | 2008-02-21

US20080042670A1

Physics

Probe station

#15 | 2008-02-21

US20080042669A1

Physics

Probe station

#16 | 2008-02-21

US20080042642A1

Electricity

Chuck for holding a device under test

#17 | 2008-02-21

US20080042376A1

Physics

Probe station

#18 | 2008-02-21

US20080042374A1

Electricity

Chuck for holding a device under test

#19 | 2008-01-31

US20080024149A1

Physics

Shielded probe for testing a device under test

#20 | 2007-10-25

US20070247178A1

Physics

Probe station with low inductance path

#21 | 2007-09-06

US20070205784A1

Physics

Switched suspended conductor and connection

#22 | 2007-08-23

US20070194778A1

Physics

Guarded tub enclosure

#23 | 2007-05-24

US20070115013A1

Physics

Chuck with integrated wafer support

#24 | 2007-05-22

US10794511

Switched suspended conductor and connection

#25 | 2007-04-05

US20070075716A1

Physics

Shielded probe for high-frequency testing of a device under test

#26 | 2007-01-09

US10848777

Probe for testing a device under test

#27 | 2007-01-04

US20070003447A1

Physics

Fluid dispensing system

#28 | 2006-02-09

US20060028200A1

Electricity

Chuck for holding a device under test

#29 | 2005-11-15

US9877823

Chuck for holding a device under test

#30 | 2005-08-18

US20050179427A1

Physics

Probe station

#31 | 2005-07-05

US9881312

Probe station

#32 | 2005-06-30

US20050140384A1

Physics

Chuck with integrated wafer support

#33 | 2005-06-09

US20050122125A1

Physics

Guarded tub enclosure

#34 | 2005-05-12

US20050099192A1

Physics

Probe station with low inductance path

#35 | 2005-03-01

US10319287

Guarded tub enclosure

InventorID:

3608054 ⎘