Beaverton, Oregon
United States
173
2017-10-12
163
2017-10-10
These are the the leading inventors for applications assigned to Cascade Microtech, Inc.:
Cascade Microtech, Inc. based in Beaverton, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Shielded probe systems with controlled testing environments
#2 | 2017-07-20 ✅ Patent 9,804,196 granted on 2017-10-31Probes with fiducial marks, probe systems including the same, and associated methods
#3 | 2016-07-07 ✅ Patent 9,741,599 granted on 2017-08-22High voltage chuck for a probe station
#4 | 2016-04-14 ✅ Patent 9,989,558 granted on 2018-06-05Probe head assemblies, components thereof, test systems including the same, and methods of operating the same
#5 | 2015-10-22 ✅ Patent 9,874,585 granted on 2018-01-23Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same
#6 | 2015-09-10 ✅ Patent 9,991,152 granted on 2018-06-05Wafer-handling end effectors with wafer-contacting surfaces and sealing structures
#7 | 2015-04-30 ✅ Patent 9,099,449 granted on 2015-08-04Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same
#8 | 2015-01-08 ✅ Patent 9,983,232 granted on 2018-05-29Prober for testing devices in a repeat structure on a substrate
#9 | 2014-08-28 ✅ Patent 9,632,108 granted on 2017-04-25Method for verifying a test substrate in a prober under defined thermal conditions
#10 | 2014-07-03 ✅ Patent 9,373,533 granted on 2016-06-21Systems and methods for providing wafer access in a wafer processing system
#11 | 2014-07-03 ✅ Patent 9,377,423 granted on 2016-06-28Systems and methods for handling substrates at below dew point temperatures
#12 | 2014-07-03SYSTEMS AND METHODS FOR ROTATIONAL ALIGNMENT OF A DEVICE UNDER TEST
#13 | 2014-05-29 ✅ Patent 9,194,885 granted on 2015-11-24Modular prober and method for operating same
#14 | 2014-05-08 ✅ Patent 9,470,753 granted on 2016-10-18Systems and methods for testing electronic devices that include low power output drivers
#15 | 2014-01-30 ✅ Patent 9,395,411 granted on 2016-07-19Method for testing a test substrate under defined thermal conditions and thermally conditionable prober
#16 | 2013-12-05MEMBRANE PROBING METHOD USING IMPROVED CONTACT
#17 | 2013-08-29 ✅ Patent 9,429,638 granted on 2016-08-30Method of replacing an existing contact of a wafer probing assembly
#18 | 2013-07-18SYSTEMS AND METHODS FOR NON-CONTACT POWER AND DATA TRANSFER IN ELECTRONIC DEVICES
#19 | 2013-03-28 ✅ Patent 9,506,973 granted on 2016-11-29High voltage chuck for a probe station
#20 | 2013-03-21RISERS INCLUDING A PLURALITY OF HIGH ASPECT RATIO ELECTRICAL CONDUITS AND SYSTEMS AND METHODS OF MANUFACTURE AND USE THEROF
#21 | 2013-02-21 ✅ Patent 9,245,317 granted on 2016-01-26Optically enhanced digital imaging system
#22 | 2013-01-31 ✅ Patent 9,110,131 granted on 2015-08-18Method and device for contacting a row of contact areas with probe tips
#23 | 2013-01-17SYSTEMS, DEVICES, AND METHODS FOR TWO-SIDED TESTING OF ELECTRONIC DEVICES
#24 | 2013-01-10 ✅ Patent 9,435,858 granted on 2016-09-06Focusing optical systems and methods for testing semiconductors
#25 | 2012-12-06 ✅ Patent 9,372,214 granted on 2016-06-21High frequency interconnect structures, electronic assemblies that utilize high frequency interconnect structures, and methods of operating the same
#26 | 2012-11-15 ✅ Patent 9,244,099 granted on 2016-01-26Probe head assemblies, components thereof, test systems including the same, and methods of operating the same
#27 | 2012-06-14 ✅ Patent 8,922,229 granted on 2014-12-30Method for measurement of a power device
#28 | 2012-05-10 ✅ Patent 8,970,240 granted on 2015-03-03Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same
#29 | 2012-04-26 ✅ Patent 8,823,406 granted on 2014-09-02Systems and methods for simultaneous optical testing of a plurality of devices under test
#30 | 2011-12-29 ✅ Patent 8,841,932 granted on 2014-09-23Prober for testing devices in a repeat structure on a substrate
#31 | 2011-12-01 ✅ Patent 8,680,879 granted on 2014-03-25Chuck for supporting and retaining a test substrate and a calibration substrate
#32 | 2011-09-22 ✅ Patent 8,344,744 granted on 2013-01-01Probe station for on-wafer-measurement under EMI-shielding
#33 | 2011-08-25 ✅ Patent 8,167,648 granted on 2012-05-01Low noise connector with cables having a center, middle and outer conductors
#34 | 2011-07-21LINE-REFLECT-REFLECT MATCH CALIBRATION
#35 | 2011-01-20 ✅ Patent 8,072,586 granted on 2011-12-06Arrangement and method for focusing a multiplane image acquisition on a prober
#36 | 2010-11-25 ✅ Patent 8,402,848 granted on 2013-03-26Probe holder
#37 | 2010-11-18 ✅ Patent 8,497,693 granted on 2013-07-30Method for testing a test substrate under defined thermal conditions and thermally conditionable prober
#38 | 2010-10-28 ✅ Patent 8,451,017 granted on 2013-05-28Membrane probing method using improved contact
#39 | 2010-10-21DIFFERENTIAL SIGNAL PROBING SYSTEM
#40 | 2010-10-07ACTIVE WAFER PROBE
#41 | 2010-10-07WAFER PROBE
#42 | 2010-09-30TEST STRUCTURE AND PROBE FOR DIFFERENTIAL SIGNALS
#43 | 2010-07-27 ✅ Patent 7,761,986 granted on 2010-07-27Membrane probing method using improved contact
#44 | 2010-07-01 ✅ Patent 7,857,631 granted on 2010-12-28Socket with a housing with contacts with beams of unequal lengths
#45 | 2010-05-27 ✅ Patent 8,410,806 granted on 2013-04-02Replaceable coupon for a probing apparatus
#46 | 2010-05-27 ✅ Patent 8,319,503 granted on 2012-11-27Test apparatus for measuring a characteristic of a device under test
#47 | 2010-05-06 ✅ Patent 8,094,925 granted on 2012-01-10Method for increasing the accuracy of the positioning of a first object relative to a second object
#48 | 2010-05-06 ✅ Patent 7,969,173 granted on 2011-06-28Chuck for holding a device under test
#49 | 2010-04-22 ✅ Patent 7,940,069 granted on 2011-05-10System for testing semiconductors
#50 | 2010-04-08 ✅ Patent 7,888,957 granted on 2011-02-15Probing apparatus with impedance optimized interface
#51 | 2009-10-29 ✅ Patent 7,898,273 granted on 2011-03-01Probe for testing a device under test
#52 | 2009-09-10 ✅ Patent 7,893,704 granted on 2011-02-22Membrane probing structure with laterally scrubbing contacts
#53 | 2009-07-30 ✅ Patent 7,876,114 granted on 2011-01-25Differential waveguide probe
#54 | 2009-07-16 ✅ Patent 7,932,737 granted on 2011-04-26Prober for testing devices in a repeat structure on a substrate
#55 | 2009-06-18 ✅ Patent 7,876,115 granted on 2011-01-25Chuck for holding a device under test
#56 | 2009-02-17 ✅ Patent 7,492,172 granted on 2009-02-17Chuck for holding a device under test
#57 | 2008-12-18 ✅ Patent 7,759,953 granted on 2010-07-20Active wafer probe
#58 | 2008-10-30 ✅ Patent 8,013,623 granted on 2011-09-06Double sided probing structures
#59 | 2008-10-09 ✅ Patent 7,750,652 granted on 2010-07-06Test structure and probe for differential signals
#60 | 2008-09-11 ✅ Patent 8,069,491 granted on 2011-11-29Probe testing structure
#61 | 2008-07-15 ✅ Patent 7,400,155 granted on 2008-07-15Membrane probing system
#62 | 2008-07-03 ✅ Patent 7,688,091 granted on 2010-03-30Chuck with integrated wafer support
#63 | 2008-07-03 ✅ Patent 7,514,944 granted on 2009-04-07Probe head having a membrane suspended probe
#64 | 2008-05-22 ✅ Patent 8,278,951 granted on 2012-10-02Probe station for testing semiconductor substrates and comprising EMI shielding
#65 | 2008-05-15 ✅ Patent 7,492,175 granted on 2009-02-17Membrane probing system
#66 | 2008-05-08 ✅ Patent 7,595,632 granted on 2009-09-29Wafer probe station having environment control enclosure
#67 | 2008-04-08 ✅ Patent 7,355,420 granted on 2008-04-08Membrane probing system
#68 | 2008-04-01 ✅ Patent 7,352,258 granted on 2008-04-01Waveguide adapter for probe assembly having a detachable bias tee
#69 | 2008-03-27 ✅ Patent 7,453,276 granted on 2008-11-18Probe for combined signals
#70 | 2008-03-06 ✅ Patent 7,489,149 granted on 2009-02-10Shielded probe for testing a device under test
#71 | 2008-03-06 ✅ Patent 7,482,823 granted on 2009-01-27Shielded probe for testing a device under test
#72 | 2008-03-06 ✅ Patent 7,550,984 granted on 2009-06-23Probe station with low noise characteristics
#73 | 2008-03-06 ✅ Patent 7,423,419 granted on 2008-09-09Chuck for holding a device under test
#74 | 2008-02-28 ✅ Patent 7,626,379 granted on 2009-12-01Probe station having multiple enclosures
#75 | 2008-02-28 ✅ Patent 7,436,194 granted on 2008-10-14Shielded probe with low contact resistance for testing a device under test
#76 | 2008-02-28 ✅ Patent 7,514,915 granted on 2009-04-07Chuck for holding a device under test
#77 | 2008-02-28 ✅ Patent 7,501,810 granted on 2009-03-10Chuck for holding a device under test
#78 | 2008-02-21 ✅ Patent 7,761,983 granted on 2010-07-27Method of assembling a wafer probe
#79 | 2008-02-21 ✅ Patent 7,616,017 granted on 2009-11-10Probe station thermal chuck with shielding for capacitive current
#80 | 2008-02-21 ✅ Patent 7,495,461 granted on 2009-02-24Wafer probe
#81 | 2008-02-21 ✅ Patent 7,456,646 granted on 2008-11-25Wafer probe
#82 | 2008-02-21 ✅ Patent 7,518,358 granted on 2009-04-14Chuck for holding a device under test
#83 | 2008-02-21 ✅ Patent 7,417,446 granted on 2008-08-26Probe for combined signals
#84 | 2008-02-21 ✅ Patent 7,498,829 granted on 2009-03-03Shielded probe for testing a device under test
#85 | 2008-02-21 ✅ Patent 7,501,842 granted on 2009-03-10Shielded probe for testing a device under test
#86 | 2008-02-21 ✅ Patent 7,688,062 granted on 2010-03-30Probe station
#87 | 2008-01-31 ✅ Patent 7,518,387 granted on 2009-04-14Shielded probe for testing a device under test
#88 | 2008-01-24 ✅ Patent 7,908,107 granted on 2011-03-15Line-reflect-reflect match calibration
#89 | 2008-01-17 ✅ Patent 7,609,077 granted on 2009-10-27Differential signal probe with integral balun
#90 | 2007-12-27 ✅ Patent 7,541,821 granted on 2009-06-02Membrane probing system with local contact scrub
#91 | 2007-12-20 ✅ Patent 7,492,147 granted on 2009-02-17Wafer probe station having a skirting component
#92 | 2007-12-13 ✅ Patent 7,443,186 granted on 2008-10-28On-wafer test structures for differential signals
#93 | 2007-12-13 ✅ Patent 7,403,028 granted on 2008-07-22Test structure and probe for differential signals
#94 | 2007-12-13 ✅ Patent 7,723,999 granted on 2010-05-25Calibration structures for differential signal probing
#95 | 2007-12-13 ✅ Patent 7,764,072 granted on 2010-07-27Differential signal probing system
#96 | 2007-12-13 ✅ Patent 7,681,312 granted on 2010-03-23Membrane probing system
#97 | 2007-11-29 ✅ Patent 7,394,269 granted on 2008-07-01Probe for testing a device under test
#98 | 2007-10-25 ✅ Patent 7,436,170 granted on 2008-10-14Probe station having multiple enclosures
#99 | 2007-10-25 ✅ Patent 7,498,828 granted on 2009-03-03Probe station with low inductance path
#100 | 2007-09-06 ✅ Patent 7,468,609 granted on 2008-12-23Switched suspended conductor and connection
Also check out Cascade Microtech, Inc.'s (Beaverton, United States) applicant profile with 27 patent applications submitted.
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