Gyeonggi-do
South Korea
18
2010-11-04
The entities that hold a legal rights for patent applications filed by inventor Jun Chung-Sam:
Chung-Sam Jun from Gyeonggi-do, KR has applied for patents for these inventions. The list has both pending applications and granted patents:
Light focusing unit and spectrum measuring apparatus having the same
#2 | 2007-08-30Method of measuring critical dimension
#3 | 2007-08-16METHOD AND APPARATUS FOR CONTROLLING LIGHT INTENSITY AND FOR EXPOSING A SEMICONDUCTOR SUBSTRATE
#4 | 2007-08-09TEST PATTERN AND METHOD FOR MEASURING SILICON ETCHING DEPTH
#5 | 2007-05-31Method of scanning a substrate, and method and apparatus for analyzing crystal characteristics
#6 | 2007-02-22Method of classifying defects
#7 | 2007-02-08Method and apparatus for inspecting a substrate
#8 | 2007-02-08METHOD OF INSPECTING A DEFECT ON A SUBSTRATE
#9 | 2007-02-08Method and apparatus for inspecting target defects on a wafer
#10 | 2007-02-01Method of measuring a surface voltage of an insulating layer
#11 | 2007-02-01Method of inspecting a substrate using ultrasonic waves and apparatus for performing the same
#12 | 2007-01-18Optical inspection tool having lens unit with multiple beam paths for detecting surface defects of a substrate and methods of using same
#13 | 2006-04-20Method and apparatus for inspecting defects in multiple regions with different parameters
#14 | 2006-01-19Method of forming a three-dimensional image of a pattern to be inspected and apparatus for performing the same
#15 | 2005-09-01Apparatus and method for measuring substrates
#16 | 2005-07-14Electron-beam inspection apparatus and methods of inspecting through-holes using clustered nanotube arrays
#17 | 2005-05-05Method and apparatus for inspecting defects
#18 | 2005-04-21Apparatus and method for measuring a thickness of a substrate
3684235 ⎘