Austin, Texas
United States
6
2010-08-19
The entities that hold a legal rights for patent applications filed by inventor Dixon David:
David Dixon from Austin, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Multi-pitch scatterometry targets
#2 | 2008-11-11Scatterometry target for determining CD and overlay
#3 | 2008-09-11Method and system to compensate for lamp intensity differences in a photolithographic inspection tool
#4 | 2008-08-28Method and system for monitoring photolithography processing based on a batch change in light sensitive material
#5 | 2008-04-03Method and system for facilitating preventive maintenance of an optical inspection tool
#6 | 2005-07-07Method and system to compensate for lamp intensity differences in a photolithographic inspection tool
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