Erwin Thiel

City:

Wilnsdorf

Country:

Germany

Published Applications:

Last publication date:

2009-01-01

Top Assignees for applications by Erwin Thiel

The entities that hold a legal rights for patent applications filed by inventor Thiel Erwin:

BASF AKTIENGESELLSCHAFT 3 Ludwigshafen, Germany
BASF SE 1 Ludwigshafen, Germany
VISTEC Semiconductor Systems GmbH 1 Wetzlar, Germany

Recent patent applications by Thiel Erwin

Erwin Thiel from Wilnsdorf, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2009-01-01

US20090006004A1

Physics

Method for Determining the Identity, Absence and Concentration of a Chemical Compound in a Medium

#2 | 2008-12-11

US20080304059A1

Physics

High-sensitivity method for detecting differences between the physically measurable properties of a sample and a reference

#3 | 2008-03-06

US20080057589A1

Physics

Method For Determining The Presence Of A Chemical Compound Which Is Homogeneously Distributed In A Medium By Means Of Cross-Correlating A Measuring Spectrum With Reference Spectra

#4 | 2006-12-21

US20060286811A1

Physics

Method of optically imaging and inspecting a wafer in the context of edge bead removal

#5 | 2006-10-12

US20060228806A1

Physics

Method for detecting the modification of a characteristic of a sample caused by an enviromental influence

InventorID:

3846876 ⎘