Nigel P. Smith

City:

Beaverton, Oregon

Country:

United States

Published Applications:

Last publication date:

2022-10-13

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Nigel P. Smith from Beaverton, US has applied for patents for these inventions. The list has both pending applications and granted patents:

MULTI-LAYER CALIBRATION FOR EMPIRICAL OVERLAY MEASUREMENT

Sample surface polarization modification in interferometric defect inspection

Interferometer with pixelated phase shift mask

Sample inspection using topography

Sub-resolution defect detection

Scanning white-light interferometry system for characterization of patterned semiconductor features

Image based overlay measurement with finite gratings

InventorID:

386667 ⎘