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Inventor profile of:

Tohru Tsujide

City:

Tokyo

Country:

Japan

Published Applications:

8

Last publication date:

2009-02-12

Top Assignees for applications by Tohru Tsujide

The entities that hold a legal rights for patent applications filed by inventor Tsujide Tohru:

  • Fab Solutions, Inc. 5 Kanagawa, Japan
  • TOPCON CORPORATION 3 Itabashi-ku, Tokyo, Japan
  • TOPCON CORPORATION 1 Tokyo, Japan

Recent patent applications by Tsujide Tohru

Tohru Tsujide from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2009-02-12
US20090039274A1
Physics

Surface contamination analyzer for semiconductor wafers

#2 | 2006-09-14
US20060202119A1
Electricity

Semiconductor device tester

#3 | 2005-12-13
US10842167
-

Semiconductor device tester

#4 | 2005-10-20
US20050230622A1
Physics

Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device

#5 | 2005-09-20
US10868582
-

Semiconductor device tester

#6 | 2005-09-13
US10831851
-

Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device

#7 | 2005-05-19
US20050106803A1
Electricity

Production managing system of semiconductor device

#8 | 2005-01-11
US10790276
-

Production managing system of semiconductor device

InventorID:

3876475 ⎘

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