Christopher F. Bevis

City:

Mountain View, California

Country:

United States

Published Applications:

Last publication date:

2009-02-12

Top Assignees for applications by Christopher F. Bevis

The entities that hold a legal rights for patent applications filed by inventor Bevis Christopher F.:

KLA-Tencor Corporation 2 San Jose, CA United States
KLA-Tencor Techologies Corporation 1 Milpitas, CA United States
KLA-TENCOR TECHNOLOGIES CORPORATION 1 Milpitas, CA United States

Recent patent applications by Bevis Christopher F.

Christopher F. Bevis from Mountain View, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2009-02-12

US20090040514A1

Physics

Method and apparatus for scanning, stitching and damping measurements of a double sided metrology inspection tool

#2 | 2006-10-19

US20060232770A1

Physics

Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool

#3 | 2006-03-07

US10759764

Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool

InventorID:

3877490 ⎘