Jan Evert Van Der Werf

City:

Eindhoven

Country:

Netherlands

Published Applications:

Last publication date:

2009-02-12

Top Assignees for applications by Jan Evert Van Der Werf

The entities that hold a legal rights for patent applications filed by inventor Van Der Werf Jan Evert:

ASML Netherlands B.V. 4 Veldhoven, Netherlands
Koninklijke Philips Electronic, N.V. 2 Eindhoven, Netherlands
KONINKLIJKE PHILIPS ELECTRONICS N.V. 1 BA Eindhoven, Netherlands

Recent patent applications by Van Der Werf Jan Evert

Jan Evert Van Der Werf from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2009-02-12

US20090041077A1

Physics

OPTICAL READ-OUT

#2 | 2007-05-24

US20070115782A1

Physics

Optical pick-up unit

#3 | 2007-05-10

US20070103753A1

Physics

Alignment of Holographic Images on Detector

#4 | 2005-10-20

US20050231732A1

Physics

Method of measuring overlay

#5 | 2005-10-20

US20050231698A1

Physics

Method of measuring alignment of a substrate with respect to a reference alignment mark

#6 | 2005-08-30

US9940819

Method of measuring alignment of a substrate with respect to a reference alignment mark

#7 | 2005-08-30

US9940818

Method of measuring overlay

InventorID:

3877899 ⎘