Cedar Park, Texas
United States
10
2009-04-09
The entities that hold a legal rights for patent applications filed by inventor Michael Mark W.:
Mark W. Michael from Cedar Park, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Electronic device and method of biasing
#2 | 2008-05-01Compensating for layout dimension effects in semiconductor device modeling
#3 | 2008-01-03Providing stress uniformity in a semiconductor device
#4 | 2007-12-27Methods of quantifying variations resulting from manufacturing-induced corner rounding of various features, and structures for testing same
#5 | 2007-12-27Test structure for measuring electrical and dimensional characteristics
#6 | 2007-12-06Contact resistance test structure and methods of using same
#7 | 2007-11-08Methods of forming contact openings
#8 | 2005-11-15Array of gate dielectric structures to measure gate dielectric thickness and parasitic capacitance
#9 | 2005-03-15Enhanced silicidation of polysilicon gate electrodes
#10 | 2005-01-11Array of gate dielectric structures to measure gate dielectric thickness and parasitic capacitance
3918991 ⎘