Daniel C. Wack

City:

Los Altos, California

Country:

United States

Published Applications:

Last publication date:

2010-11-02

Top Assignees for applications by Daniel C. Wack

The entities that hold a legal rights for patent applications filed by inventor Wack Daniel C.:

KLA-TENCOR TECHNOLOGIES CORPORATION 9 Milpitas, CA United States
KLA-Tencor Corporation 2 Milpitas, CA United States

Recent patent applications by Wack Daniel C.

Daniel C. Wack from Los Altos, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2010-11-02

US11999814

Method for optimizing the configuration of a scatterometry measurement system

#2 | 2010-05-11

US11879227

Model-based measurement of semiconductor device features with feed forward use of data for dimensionality reduction

#3 | 2009-08-06

US20090195779A1

Physics

System for scatterometric measurements and applications

#4 | 2009-07-30

US20090190141A1

Physics

SYSTEM FOR MEASURING A SAMPLE WITH A LAYER CONTAINING A PERIODIC DIFFRACTING STRUCTURE

#5 | 2009-05-28

US20090135416A1

Physics

Parametric profiling using optical spectroscopic systems

#6 | 2008-04-10

US20080084567A1

Physics

System for scatterometric measurements and applications

#7 | 2008-02-14

US20080037005A1

Physics

System for measuring a sample with a layer containing a periodic diffracting structure

#8 | 2007-10-09

US10327466

Parametric profiling using optical spectroscopic systems

#9 | 2006-08-29

US9671715

System for scatterometric measurements and applications

#10 | 2005-12-15

US20050274901A1

Physics

System for scatterometric measurements and applications

InventorID:

3954167 ⎘