Ehud Tirosh

City:

Jerusalem

Country:

Israel

Published Applications:

Last publication date:

2009-06-11

Top Assignees for applications by Ehud Tirosh

The entities that hold a legal rights for patent applications filed by inventor Tirosh Ehud:

Ehud Tirosh from Jerusalem, IL has applied for patents for these inventions. The list has both pending applications and granted patents:

Optical inspection apparatus for substrate defect detection

Optical inspection method for substrate defect detection

Method and apparatus for reticle inspection using aerial imaging

Optical inspection apparatus for substrate defect detection

InventorID:

3963830 ⎘