Ralf Friedrich

City:

Giessen

Country:

Germany

Published Applications:

Last publication date:

2009-06-25

Top Assignees for applications by Ralf Friedrich

The entities that hold a legal rights for patent applications filed by inventor Friedrich Ralf:

Ralf Friedrich from Giessen, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

Method for optical inspection, detection and visualization of defects on disk-shaped objects

Method of determining geometric parameters of a wafer

Method of learning a knowledge-based database used in automatic defect classification

InventorID:

3973670 ⎘