Daniel Skiera

City:

Langgoens

Country:

Germany

Published Applications:

Last publication date:

2012-06-28

Top Assignees for applications by Daniel Skiera

The entities that hold a legal rights for patent applications filed by inventor Skiera Daniel:

VISTEC SEMICONDUCTOR SYSTEMS GMBH 3 Weilburg, Germany
KLA-TENCOR MIE GMBH 1 Weilburg, Germany

Recent patent applications by Skiera Daniel

Daniel Skiera from Langgoens, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2012-06-28

US20120163698A1

Physics

Method for inspection and detection of defects on surfaces of disc-shaped objects and computer system with a software product for carrying out the method

#2 | 2009-06-25

US20090161097A1

Physics

Method for optical inspection, detection and visualization of defects on disk-shaped objects

#3 | 2008-10-09

US20080249728A1

Physics

METHOD FOR DETECTING DEFECTS ON THE BACK SIDE OF A SEMICONDUCTOR WAFER

#4 | 2008-08-28

US20080208523A1

Physics

Method of determining geometric parameters of a wafer

InventorID:

3973671 ⎘