Tektronix, Inc.

City:

Country:

United States

Published Applications:

Last publication date:

2014-05-22

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Tektronix, Inc. from , US has applied for patents for these inventions. The list has both pending applications and granted patents:

Amplitude flatness and phase linearity calibration for RF sources

Magnitude and phase response calibration of receivers

Signal acquisition system having reduced probe loading of a device under test

Apparatus and method for performing burst triggering in a test and measurement instrument

InventorID:

410575 ⎘