Mountain View, California
United States
14
2023-03-23
The entities that hold a legal rights for patent applications filed by inventor Kuznetsov Alexander:
Alexander Kuznetsov from Mountain View, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Systems and Methods for Improved Computer Vision in On-Device Applications
#2 | 2020-01-23SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR FAST AUTOMATIC DETERMINATION OF SIGNALS FOR EFFICIENT METROLOGY
#3 | 2017-03-16Compressive sensing for metrology
#4 | 2016-12-13Compressive sensing for metrology
#5 | 2016-05-19INSPECTION SYSTEM AND METHOD USING AN OFF-AXIS UNOBSCURED OBJECTIVE LENS
#6 | 2016-04-21Metrology of multiple patterning processes
#7 | 2016-01-26Optical metrology of periodic targets in presence of multiple diffraction orders
#8 | 2015-11-12Signal response metrology for scatterometry based overlay measurements
#9 | 2015-02-12Methods and apparatus for patterned wafer characterization
#10 | 2014-11-27Metrology system optimization for parameter tracking
#11 | 2014-10-14Metrology systems and methods for high aspect ratio and large lateral dimension structures
#12 | 2014-08-07Method of electromagnetic modeling of finite structures and finite illumination for metrology and inspection
#13 | 2014-06-19Integrated use of model-based metrology and a process model
#14 | 2013-08-29Optical metrology using targets with field enhancement elements
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