Axel Nackaerts

City:

Haarsrode

Country:

Belgium

Published Applications:

Last publication date:

2008-06-26

Top Assignees for applications by Axel Nackaerts

The entities that hold a legal rights for patent applications filed by inventor Nackaerts Axel:

Axel Nackaerts from Haarsrode, BE has applied for patents for these inventions. The list has both pending applications and granted patents:

Semiconductor device for measuring an overlay error, method for measuring an overlay error, lithographic apparatus and device manufacturing method

InventorID:

4201700 ⎘