Saitama
Japan
35
2025-06-26
The entities that hold a legal rights for patent applications filed by inventor Watanabe Daisuke:
Daisuke Watanabe from Saitama, JP has applied for patents for these inventions. The list has both pending applications and granted patents:
ELECTRONIC PEN
#2 | 2025-03-13TESTING APPARATUS
#3 | 2025-01-30TERMINAL DEVICE AND POSITION DETECTION SENSOR INCLUDING SENSOR ELECTRODES AND LINEAR MEMBERS ARRANGED IN BETWEEN BACKGROUND
#4 | 2024-03-21Terminal device and position detection sensor including sensor electrodes and linear members arranged in between background
#5 | 2023-04-20Electronic pen core body and electronic pen
#6 | 2022-12-29Knock-type electronic pen including first and second position indicators located at different ends of a tubular casing
#7 | 2022-12-01PRESSURE-SENSITIVE ADHESIVE TAPE
#8 | 2022-11-24Pressure-sensitive adhesive tape
#9 | 2022-11-24Pressure-sensitive adhesive tape
#10 | 2022-03-17Position detection device
#11 | 2022-03-03Terminal device and position detection sensor including sensor electrodes and linear members arranged in between
#12 | 2022-02-17Electronic pen core body and electronic pen
#13 | 2015-11-19Mounting device for object to be mounted
#14 | 2015-10-29Mounting device for object to be mounted
#15 | 2013-09-12Sensor of electromagnetic induction type coordinate input device
#16 | 2011-10-06Memory device, manufacturing method for memory device and method for data writing
#17 | 2011-09-29Wafer unit for testing semiconductor chips and test system
#18 | 2011-09-08Test apparatus and manufacturing method
#19 | 2011-08-18Test apparatus, transmission apparatus, receiving apparatus, test method, transmission method and receiving method
#20 | 2011-08-11Electronic device and manufacturing method
#21 | 2011-06-23Semiconductor wafer, semiconductor circuit, substrate for testing and test system
#22 | 2011-06-02WAFER FOR TESTING, TEST SYSTEM, AND SEMICONDUCTOR WAFER
#23 | 2011-06-02Test system and substrate unit for testing
#24 | 2011-06-02Wafer unit for testing and test system
#25 | 2011-05-26Apparatus for manufacturing substrate for testing, method for manufacturing substrate for testing and recording medium
#26 | 2011-04-28TEST APPARATUS
#27 | 2011-01-27Method for Producing Wafer Lens
#28 | 2010-12-09Test apparatus and test method
#29 | 2010-08-19Transfer circuit, transmitter, receiver and test apparatus
#30 | 2010-08-12MANUFACTURING METHOD OF IMAGE PICK-UP DEVICE, IMAGE PICK-UP DEVICE AND OPTICAL ELEMENT
#31 | 2010-06-24TRANSMISSION SYSTEM AND TEST APPARATUS
#32 | 2010-04-15Test apparatus and test method
#33 | 2010-02-25Test apparatus and manufacturing method
#34 | 2010-02-04Test apparatus and electronic device
#35 | 2009-12-03Test system, electronic device, and test apparatus
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