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Inventor profile of:

Young-Jee YOON

City:

Gyeonggi-do

Country:

South Korea

Published Applications:

6

Last publication date:

2007-05-31

Top Assignees for applications by Young-Jee YOON

The entities that hold a legal rights for patent applications filed by inventor YOON Young-Jee:

  • SAMSUNG ELECTRONICS CO., LTD. 3 Gyeonggi-Do, South Korea
  • SAMSUNG ELECTRONICS CO., LTD. 1 Gyeonggid-do, South Korea
  • Samsung Electronics Co., Ltd 1 , South Korea

Recent patent applications by YOON Young-Jee

Young-Jee YOON from Gyeonggi-do, KR has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2007-05-31
US20070120220A1
Physics

Methods of compensating for an alignment error during fabrication of structures on semiconductor substrates

#2 | 2007-05-31
US20070120054A1
Physics

Method of scanning a substrate, and method and apparatus for analyzing crystal characteristics

#3 | 2007-02-08
US20070031025A1
Physics

Method and apparatus for inspecting a substrate

#4 | 2007-02-08
US20070030479A1
Physics

METHOD OF INSPECTING A DEFECT ON A SUBSTRATE

#5 | 2005-09-01
US20050191768A1
Electricity

Apparatus and method for measuring substrates

#6 | 2005-07-14
US20050151456A1
Performing operations; transporting

Electron-beam inspection apparatus and methods of inspecting through-holes using clustered nanotube arrays

InventorID:

4351105 ⎘

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