Munich
Germany
9
2007-10-11
The entities that hold a legal rights for patent applications filed by inventor Sattler Sebastian:
Sebastian Sattler from Munich, DE has applied for patents for these inventions. The list has both pending applications and granted patents:
Apparatus and method for tolerance analysis for digital and/or digitized measure values
#2 | 2007-09-27Measuring device and method for measuring relative phase shifts of digital signals
#3 | 2007-09-20Test apparatus and method for testing analog/digital converters
#4 | 2007-08-02Electronic test circuit for an integrated circuit and methods for testing the driver strength and for testing the input sensitivity of a receiver of the integrated circuit
#5 | 2007-04-19Test apparatus for digitized test responses, method for testing semiconductor devices and diagnosis method for a semiconductor device
#6 | 2007-03-22Device and method for testing integrated circuits
#7 | 2007-03-22Electrical circuit and method for testing electronic component
#8 | 2006-12-28Device and method for measuring jitter
#9 | 2005-10-20Electrical circuit and method for testing integrated circuits
4377724 ⎘